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Scattering diffraction device - List of Manufacturers, Suppliers, Companies and Products

Scattering diffraction device Product List

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[Data DL available/EBSD] Measurement of internal strain in wire materials

[Data DL available/EBSD] Measurement of internal strain in wire materials

By confirming the shape changes of the metal structure and measuring internal strain using EBSD, it is possible to determine whether the bending processes of leaf springs, hair springs, and others are appropriate.

Electron Backscatter Diffraction Pattern (EBSD) allows for the following when combined with a Scanning Electron Microscope (SEM): - Analysis of crystal orientation after cross-section formation - Confirmation of shape changes in metal microstructures and internal strain distribution In this case, we introduce "internal strain measurement of wire materials" using EBSD. This measurement technique is useful for determining whether bending processes, such as those for leaf springs and hair springs, are appropriate and for setting processing conditions. We encourage you to give it a try. Additionally, our company conducts various cross-sectional analyses using TEM and surface analysis using XPS, enabling multifaceted analytical evaluations. Both sales and technical staff are available to assist directly, so we would be grateful if you could feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/

  • Other metal materials
  • Contract measurement
  • Other microscopes

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[EBSD] Electron Backscatter Diffraction Method

[EBSD] Electron Backscatter Diffraction Method

It is possible to easily obtain crystal information over a wide area.

This is a method for orientation analysis of crystalline samples using EBSD. It allows for easier and broader acquisition of crystal information compared to electron diffraction methods. EBSP: Electron Backscatter Pattern, also referred to as SEM-OIM or OIM. - Measurement of the surface orientation of single crystal grains is possible. - Orientation measurement of the measurement area is possible. - Observation of crystal grain size is possible. - Observation of twin grain boundaries (corresponding grain boundaries) is possible. - Extraction of specific crystal orientations is possible. - Measurement of the rotation angle of adjacent crystal grains is possible. - Evaluation of grains larger than 10 nm is possible using transmission methods.

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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Observation of the metal structure of wire (spring material) using DL/EBSD.

Observation of the metal structure of wire (spring material) using DL/EBSD.

Observing metal microstructures with EBSD allows for smooth consideration of material selection and changes.

Electron Backscatter Diffraction Pattern (EBSD) allows for the following when combined with a Scanning Electron Microscope (SEM): - Separation of phases with different crystal systems - Distribution ratio and crystal orientation analysis for each separated phase In this case, we introduce "metal microstructure observation of wire (spring material) using EBSD." We investigated the changes in metal microstructure during the processing of spring material (drawing with a diameter of Φ1.00mm and 0.07mm) and confirmed that the metal microstructure changes after drawing. This measurement technique is very useful for selecting metal materials and comparing during material changes. We encourage you to give it a try. Additionally, our company conducts various cross-sectional analyses using TEM and surface analysis using XPS, allowing for multifaceted analytical assessments. Both sales and technical staff are available to assist directly, so please feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/

  • Other metal materials
  • Contract measurement
  • Other microscopes

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[Data Download Available/EBSD] Evaluation of Aluminum Sputter Films Using EBSD

[Data Download Available/EBSD] Evaluation of Aluminum Sputter Films Using EBSD

The electron backscatter diffraction method (EBSD) is useful for evaluating the performance of aluminum sputter films and selecting substrate materials.

Electron Backscatter Diffraction Pattern (EBSD) can be combined with Scanning Electron Microscopy (SEM) to enable the following: ● Measurement of the shape and orientation of micro-regions of crystal grains ● Confirmation of the orientation of crystals relative to a reference orientation ● Measurement of internal strain in materials from information on crystal orientation differences In this case, we introduce "Evaluation of Aluminum Sputter Films Using EBSD." This measurement technique is useful for evaluating the performance of aluminum sputter films and for substrate selection. It can also be applied to ceramic materials if there is orientation evaluation and crystallinity. We encourage you to give it a try. In addition to EBSD and SEM, our company also conducts various cross-sectional analyses using TEM and surface analysis using XPS, allowing for multifaceted analytical evaluations. Both sales and technical staff are available to assist directly, so we would appreciate it if you could feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/

  • Other metal materials
  • Sputtering Equipment
  • Ceramics

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Data DL available: EBSD Measurement of Samarium Cobalt Magnet

Data DL available: EBSD Measurement of Samarium Cobalt Magnet

The orientation distribution of the magnet can be understood through SEM and EBSD, allowing for the assessment of product performance and changes over time.

Electron Backscatter Diffraction Pattern (EBSD) allows for the understanding of the crystal orientation distribution of materials when combined with a Scanning Electron Microscope (SEM). This case introduces "EBSD measurement of samarium cobalt magnets." Many customers are utilizing this technology for performance evaluation and improvement of various magnets. Please take a look at the PDF materials. In addition to EBSD and SEM, our company also conducts various cross-sectional analyses using TEM and surface analysis using XPS, providing multifaceted analytical services. Both sales and technical staff are available for direct assistance, so we would be grateful if you could feel free to consult with us. Seiko Future Creation Official Website: https://www.seiko-sfc.co.jp/

  • Other metal materials
  • magnet
  • Contract Analysis

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